Professors

Xingyi Zhang

 

Name: Zhang Xingyi
 
Date of Birth: Jan. 21 1979
Nationality: China
Institution: College of Civil Engineering and Mechanics, Lanzhou University
Address: 222 Tinashe Road, Lanzhou 730000, China
Tel: +86-86-931-891-4561, Fax: +86-931-891-4561
Email:  zhangxingyi@lzu.edu.cn
Education
Sep. 2012-Jun. 20017   Ph.D. in Solid Mechanics, School of Civil Engineering and Mechanics,
Lanzhou University, Lanzhou, China
Supervisor: Prof. Zhou Youhe
Sep. 2003-Jun. 2005   M.E. in Solid Mechanics, School of Civil Engineering and Mechanics, Lanzhou University, Lanzhou, China
Supervisor: Prof. Zhou Youhe
Sep. 1999-Jun. 2003    B.E. in Theoretical and Applied Mechanics, School of Civil Engineering and Mechanics, Lanzhou University, Lanzhou, China
Appointments
Jul. 2008-Dec.2010     Lecturer, College of Civil Engineering and Mechanics, Lanzhou University, Lanzhou, China
Jul. 2009-Aug. 2009    Visiting scholar, Institute of fluid science, Tohoku University, Japan
Dec.2010- present      Professor, College of Civil Engineering and Mechanics, Lanzhou University, Lanzhou, China
Research Areas
Experimental mechanics, Electromagnetic solid mechanics.
Awards
2016     National Natural Science Foundation--Outstanding Youth Foundation
2015     National Youth Talent Supporting Program
2015     “Xu Zhilun” Excellent Teacher Award for Mechanics
2012     Winner of Education Ministry's New Century Excellent Talents Supporting Plan
2010     National Excellent Doctoral Dissertation
Refereed Publications
2018
1. Liu Cong, Zhang Xingyi*, and Zhou Youhe, Coherent Gradient Sensor for Curvature Measurement in Extreme Environments, Advances in Optics: Reviews, Book Series, Vol. 1
2017
2. Liu Cong, Zhang Xinyi*, Liu Miao, et al. Real-time stress evolution in a high temperature superconducting thin film caused by a pulse magnetic field[J]. Thin Solid Films, 2017, 639: 47-55.
2016
3. Yi Huang, Xingyi Zhang*, You-He Zhou, Thermal properties of a cylindrical YBa2Cu3Ox superconductor in a levitation system: Triggered by the nonlinear dynamics, Superconductors Science and Technology, Accepted, 2016.
4. Cong Liu, Xingyi Zhang*, You-He Zhou, Multiplication method for sparse interferometric fringes, Optics Express, Vol. 24, Iss. 7, pp. 7693–7702 (2016).
2015
5. Cong Liu, Xingyi Zhang*, Jun Zhou and Youhe Zhou, The coherent gradient sensor for thin film curvature measurements in multiple media, Optics and Lasers in Engineering, 66(2015): 92-97.
6. Wei Liu, Xingyi Zhang*, Jun Zhou and Youhe Zhou,Delamination strength of the soldered joint in YBCO coated conductors and its enhancement, IEEE trans. Appl. Supercond., 25 (4) (2015): 6606109.
2014
7. Xingyi Zhang*, Wei Liu, Jun Zhou, Donghua Yue, Jun Wang, Cong Liu, Yi Huang, Yong Liu and Youhe Zhou, A direct tensile device to investigate the critical current properties in superconducting tapes,Rev. Sci. Instrum., 85, 025103 (2014).
Wei Liu, Xingyi Zhang*, Yong Liu, Jun Zhou and Youhe Zhou, Lap Joint Characteristics of the YBCO Coated Conductors Under Axial Tension, IEEE Trans. Appl. Supercond., 24(6), 2014, 6600805.
2013
8. Donghua Yue, Xingyi Zhang*, Jun Zhou and Youhe Zhou, Current transport of the [001] -tilt low-angle grain boundary in high temperature superconductors, Applied Physics Letters, 103, 232602 (2013).
9. Liu cong, Xingyi Zhang*, Jun Zhou and Youhe Zhou, A general coherent gradient sensor for film curvature measurements: error analysis without temperature constraint, Optics and Lasers in Engineering, 51(2013): 808-812.
10. Xingyi Zhang*, Yi Huang, Jun Zhou and Youhe Zhou, Experimental and theoretical investigations on the singularity of the intensity factor of the current in high temperature superconductors, Superconductors Science and Technology, 26(2013) 085012.
11. Xingyi Zhang*, Donghue Yue, Jun Zhou and Youhe Zhou, Self-enhancement of the critical current YBaCuO coated conductors caused by the axial tension, Applied Physics Letters, 103 (2013), 042602.
12. Cong Liu, Xingyi Zhang*, Jun Zhou and Youhe Zhou, The coherent gradient sensor for film curvature measurements at cryogenic temperature, Optics Express, Vol. 21, Iss. 22, pp. 26352–26362 (2013).